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1 Pertemuan 5 Fabrikasi IC CMOS Matakuliah : H0362/Very Large Scale Integrated Circuits Tahun : 2005 Versi : versi/01
17

Pertemuan 5 Fabrikasi IC CMOS

Feb 19, 2016

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Pertemuan 5 Fabrikasi IC CMOS. Matakuliah: H0362/Very Large Scale Integrated Circuits Tahun: 2005 Versi: versi/01. Learning Outcomes. Pada Akhir pertemuan ini, diharapkan mahasiswa akan dapat menyebutkan proses fabrikasiIC CMOS. IC Fabrication. - PowerPoint PPT Presentation
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Page 1: Pertemuan 5 Fabrikasi IC CMOS

1

Pertemuan 5 Fabrikasi IC CMOS

Matakuliah : H0362/Very Large Scale Integrated CircuitsTahun : 2005Versi : versi/01

Page 2: Pertemuan 5 Fabrikasi IC CMOS

2

Learning Outcomes

Pada Akhir pertemuan ini, diharapkan mahasiswa akan dapat menyebutkan proses fabrikasiIC CMOS.

Page 3: Pertemuan 5 Fabrikasi IC CMOS

3

IC Fabrication

Sumber: http://mems.cawru.edu/shortcourse/figure/I_2.1.gif

Page 4: Pertemuan 5 Fabrikasi IC CMOS

4

Silicon Processing

2

Silicon wafer

Sumber: http://www.amd.com

Diameter

Wafer

Die sites

Page 5: Pertemuan 5 Fabrikasi IC CMOS

5

Material Growth & Deposition

Silicon oxide

Silicon wafer

O2 flow

Silicon wafer

SiO2 layerXSi

Xox

Growth phase Final structure

Substrate

CVD oxide

SiO2 molecues

Page 6: Pertemuan 5 Fabrikasi IC CMOS

6

IC Layers

Ion implanterIon source accelerator Magnetic mass

separator

Ion beamwafer

IonSilicon wafer

Silicon nuclei

electron cloud

x0

Page 7: Pertemuan 5 Fabrikasi IC CMOS

7

Lythography

poly

substrate

poly

substrate

After oxide deposition After CMP

Glass Pattern on underside

Page 8: Pertemuan 5 Fabrikasi IC CMOS

8

Lythography

Spinning waferPhotoresist spray

Vcuum chuckResist application

Photoresist coating

Coated wafer

Wafer

Flat resistEdge bead Edge bead

Beading

Page 9: Pertemuan 5 Fabrikasi IC CMOS

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Lythography

UV

Reticle

Resist-coatedWafer surface

Reticleshadow

Projection optics(not shown)

Exposure step

Page 10: Pertemuan 5 Fabrikasi IC CMOS

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Lythography

Wafer

UV

Reticle

Resist

Exposure pattern

Wafer

After development and rinsing

Hardenedresist layer

Page 11: Pertemuan 5 Fabrikasi IC CMOS

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Lythography

Hardenedresist layer

SubstrateInitial patterning of resist

Oxide layer

After etching process

Substrate

Pattern oxide layer

Page 12: Pertemuan 5 Fabrikasi IC CMOS

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Lythography

Incoming ion beam

Substrate

Arsenic ions

Doped n-type region

Substraten+ n+

Page 13: Pertemuan 5 Fabrikasi IC CMOS

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CMOS Process Flow

p-epitaxial layer

p+ substrate

a. Starting wafer with epitaxial layern-well

p, Na

b. Creation of n-well in p-epitaxial layer

n-wellp, Na

c. Active area definition using nitride / oxide

p, Nan-well

d. Silicon etch

Nitridep, Na

n-well

e. Field oxide growth

FOX FOX FOX FOX

p, Nan-well

f. Surface preparation

Page 14: Pertemuan 5 Fabrikasi IC CMOS

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CMOS Process Flow

a. Gate oxide growth

p, Nan-well

b. Gate oxide growthPoly gate deposition & patterning

p, Nan-well

poly

c. pSelect mask and implant

p, Nan-well

resist

Boron implant

p+ implantd. nSelect mask and implant

p, Nan-well

resist

Arsenic implant

n+ implant

Page 15: Pertemuan 5 Fabrikasi IC CMOS

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CMOS Process Flow

a. After anneal and CVD oxide

p, Nan-well

b. After CVD oxide active contact, W plugs

p, Nan-well

W W W W W W c. Metal 1 coating and patterning

p, Nan-well

Metal 1

Metal bonding pad

Bond

Bonding pad

Ke pin IC

Overglasswire

Page 16: Pertemuan 5 Fabrikasi IC CMOS

16

Design Rules

wp

wp

Sp-p

poly

poly

Wp = minimum width of polysilicon lineSp-p = minimum poly-topoly spacing

Page 17: Pertemuan 5 Fabrikasi IC CMOS

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RESUME

• IC Fabrication: Flow of process.• Silicon Processing: wafer, material growth,

deposition.• Lythography: pattern, photoresist coating,

exposure steps, etching, n-type.• CMOS Process flow.• Design rules